General Information

Short name: AFM Bruker

Device name: DIMENSION icon XR Bruker

Manufacturer: Bruker Corporation

Installation location: P8 cleanroom

Delivery date: 19.06.2023

Device description:

Atomic force microscopy (AFM) is a versatile imaging technique used to map the topography and study the material's properties on a nanoscale. AFM uses a very sharp probe, which is scanned across the sample and interacts with its surface. The interaction between the probe and the sample surface gives rise to either attractive or repulsive forces. These forces provide information about surface topography. Depending on the measurement mode used, different information, such as the surface topography of force-displacement curves, can be obtained.

Specifications

Imaging Modes: Contact, Tapping, PeakForce Tapping

X/Y Scan Range (µm): ≤ 90 × 90

Z Range (µm): ≥ 12

System Drift: < 200 pm/min

Sample Size: ≤210 mm in diameter, ≤ 15 mm thick

Motorized Position: 150 × 180 mm inspectable area with manually rotating chuck; 2 μm repeatability, unidirectional; 3 μm repeatability, bidirectional

Optics: Auto focus and digital zoom; < 1 μm resolution; viewing area is 180 to 1465 μm